Statistical Modeling of Manufacturing Uncertainties for Microstrip Filters

Abraham E. Ortega P., Leonardo R.A.X. de Menezes, Humberto Abdalla Jr.

Abstract


This work presents a technique to characterize the errors that occur in the process of manufacturing into electromagnetic simulations of microwave devices. The procedure combines the unscented transform (UT) with simulations. The use of the UT allows efficient use of computational resources for the characterization of the random variables modeling the uncertainty. The technique was validated with the simulation, construction, and test of several sets of identical microstrip filters with very good results. Although the combination of UT and electromagnetic simulators was presented for microstrip filters, it can also be used for different types of microwave devices.

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References


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DOI: http://dx.doi.org/10.1590/S2179-10742011000100018

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